10 results
Understanding the Influence of Receptive Field and Network Complexity in Neural Network-Guided TEM Image Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 13 September 2022, pp. 1896-1904
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- December 2022
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Extending Bragg Interferometry for the Study of Magic Angle Trilayer Graphene
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1768-1769
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- August 2022
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Understanding the Role of Neural Network Complexity and Receptive Field in Identifying Nanoparticles in TEM Images
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 3050-3052
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- August 2022
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Maximizing Neural Net Generalizability and Transfer Learning Success for Transmission Electron Microscopy Image Analysis in the Face of Small Experimental Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3124-3126
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- August 2022
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Synthetic Data Curation Strategies for Robust Model Development: A Case Study with HRTEM Micrograph Segmentation
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3098-3100
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- August 2022
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Machine Learning Pipeline for Segmentation and Defect Identification from High-Resolution Transmission Electron Microscopy Data
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- Microscopy and Microanalysis / Volume 27 / Issue 3 / June 2021
- Published online by Cambridge University Press:
- 06 May 2021, pp. 549-556
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- June 2021
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Architecture Optimization and Interpretability in Neural Networks for HRTEM Segmentation
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1476-1477
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- August 2020
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Achieving High-resolution of Large Specimens Using Aberration-corrected Tomography
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1860-1862
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- August 2020
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Machine Learning for High Throughput HRTEM Analysis
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 150-151
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- August 2019
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Linear and Nonlinear Reconstruction Algorithms for Atomic-Resolution Tomography Using Phase Contrast Electron Microscopy
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 110-111
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- August 2018
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